发明名称 SEMICONDUCTOR DEVICES HAVING FIELD EFFECT TRANSISTORS
摘要 A semiconductor device having a field effect transistor and a method of fabricating the same. In-situ doped epitaxial patterns are respectively formed at both sidewalls of a protruded channel pattern from a substrate by performing an in-situ doped epitaxial growth process. The in-situ doped epitaxial pattern has a conformal impurity concentration throughout. Accordingly, source/drain regions with a conformal impurity concentration are connected throughout a channel width of a channel region including both sidewalls of a protruded channel pattern. As a result, it is possible to maximize a driving current of the filed effect transistor, and an on-off characteristic can be highly stabilized.
申请公布号 US2008036001(A1) 申请公布日期 2008.02.14
申请号 US20070832589 申请日期 2007.08.01
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 YUN EUN-JUNG;CHO HYE-JIN;KIM DONG-WON;KIM SUNG-MIN
分类号 H01L27/01;H01L29/78;H01L21/336;H01L21/8234;H01L29/423;H01L29/786 主分类号 H01L27/01
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