发明名称 GaxIn1-xN SUBSTRATE AND GaxIn1-xN SUBSTRATE CLEANING METHOD
摘要 <p>It is possible to provide a Ga<SUB>x</SUB>In<SUB>1-x</SUB>N substrate capable of achieving a stable growth of a high-quality epitaxial film and a cleaning method for obtaining the Ga<SUB>x</SUB>In<SUB>1-x</SUB>N substrate. When the Ga<SUB>x</SUB>In<SUB>1-x</SUB>N substrate has a 2-inch diameter, the number of particles existing on the Ga<SUB>x</SUB>In<SUB>1-x</SUB>N substrate and having a particle diameter not smaller than 0.2 µm is not greater than 20. Moreover, in a photoelectric spectrum on the surface of the Ga<SUB>x</SUB>In<SUB>1-x</SUB>N substrate obtained by the X-ray photoelectric spectrum method at the detection angle of 10 degrees, the ratio of the peak area of the C<SUB>1s</SUB> electron and the N<SUB>1s</SUB> electron (peak area of C<SUB>1s</SUB> electron/peak area of N<SUB>1s</SUB> electron) is not greater than 3.</p>
申请公布号 WO2008018237(A1) 申请公布日期 2008.02.14
申请号 WO2007JP62075 申请日期 2007.06.15
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD.;UEMURA, TOMOKI;NAKAHATA, HIDEAKI 发明人 UEMURA, TOMOKI;NAKAHATA, HIDEAKI
分类号 H01L21/304;B08B3/08;B08B3/12;C30B29/38;H01L33/32 主分类号 H01L21/304
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