发明名称 |
GaxIn1-xN SUBSTRATE AND GaxIn1-xN SUBSTRATE CLEANING METHOD |
摘要 |
<p>It is possible to provide a Ga<SUB>x</SUB>In<SUB>1-x</SUB>N substrate capable of achieving a stable growth of a high-quality epitaxial film and a cleaning method for obtaining the Ga<SUB>x</SUB>In<SUB>1-x</SUB>N substrate. When the Ga<SUB>x</SUB>In<SUB>1-x</SUB>N substrate has a 2-inch diameter, the number of particles existing on the Ga<SUB>x</SUB>In<SUB>1-x</SUB>N substrate and having a particle diameter not smaller than 0.2 µm is not greater than 20. Moreover, in a photoelectric spectrum on the surface of the Ga<SUB>x</SUB>In<SUB>1-x</SUB>N substrate obtained by the X-ray photoelectric spectrum method at the detection angle of 10 degrees, the ratio of the peak area of the C<SUB>1s</SUB> electron and the N<SUB>1s</SUB> electron (peak area of C<SUB>1s</SUB> electron/peak area of N<SUB>1s</SUB> electron) is not greater than 3.</p> |
申请公布号 |
WO2008018237(A1) |
申请公布日期 |
2008.02.14 |
申请号 |
WO2007JP62075 |
申请日期 |
2007.06.15 |
申请人 |
SUMITOMO ELECTRIC INDUSTRIES, LTD.;UEMURA, TOMOKI;NAKAHATA, HIDEAKI |
发明人 |
UEMURA, TOMOKI;NAKAHATA, HIDEAKI |
分类号 |
H01L21/304;B08B3/08;B08B3/12;C30B29/38;H01L33/32 |
主分类号 |
H01L21/304 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|