| 摘要 |
PROBLEM TO BE SOLVED: To provide an electronic component testing device which is capable of performing a test at an accurate temperature in consideration of self-heating of an electronic component during testing. SOLUTION: An electronic component testing device 1, which performs a test pressing an IC terminal against a contact part 51 of a test head 5, comprises a temperature operation means 501 which calculates an actual temperature of the IC based on a signal from a temperature sensor 2D provided in the IC. COPYRIGHT: (C)2008,JPO&INPIT
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