| 摘要 |
PROBLEM TO BE SOLVED: To provide a liquid crystal display device in which the cause of defective display is easily found, and an inspecting method therefor. SOLUTION: First wires 6 arranged on a first substrate 2 are electrically connected to a driver LSI7 via an ACF 12. Wide test sections 14 are arranged on the first wires 6 in a staggered configuration. Profiles of the test sections 14 can be shaped like polygons, circles, or ellipses, or can take on shapes in which only one side of the first wire 6 in the width direction is expanded. When the test section 14 is irradiated with a laser beam, a passivation film is removed while reducing risk of disconnection of the first wire 6, and as a result, the cause of the defective display of the liquid crystal display device is easily found. COPYRIGHT: (C)2008,JPO&INPIT
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