发明名称 METHOD OF DRY ETCHING OXIDE SEMICONDUCTOR FILM
摘要 Provided is a dry etching method for an oxide semiconductor film containing at least In, Ga, and Zn, which includes etching an oxide semiconductor film in a gas atmosphere containing a halogen-based gas.
申请公布号 US2008038929(A1) 申请公布日期 2008.02.14
申请号 US20070775561 申请日期 2007.07.10
申请人 CANON KABUSHIKI KAISHA 发明人 CHANG CHIENLIU
分类号 H01L21/311 主分类号 H01L21/311
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