发明名称 Method of setting reference data for inspection of fillets and inspection device using same
摘要 Reference data for automatically inspecting shapes of fillets formed on a substrate are set to an inspection device that illuminates the substrate from specified directions to generate an image. For each type of components mounted to the substrate, a database is prepared, registering sets of reference data corresponding to different fillet shapes in correlation with heights of solder for forming fillets having these shapes. After components to be an object of inspection are identified, specified steps are carried out on each of these components, including the step of obtaining data on the height of solder for forming the fillet related to a land for which a target area for inspection has been set and reading out reference data corresponding to the data obtained from the reference data registered in the database.
申请公布号 US2008040058(A1) 申请公布日期 2008.02.14
申请号 US20070880169 申请日期 2007.07.20
申请人 OMRON CORPORATION 发明人 FUJII YOSHIKI;DOI YASUTOMO;NAKAJIMA AKIRA;MORIYA TOSHIHIRO;NAKAJIMA YASUAKI
分类号 G06F19/00;G01B11/24;G01N21/93;G01N21/956;H05K3/34;H05K13/08 主分类号 G06F19/00
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