METHOD AND CIRCUIT FOR DETECTING AND COMPENSATING FOR A DEGRADATION OF A SEMICONDUCTOR DEVICE

摘要

A degradation detection method and circuit system for responding to degradation. The circuit system is located within a semiconductor device and comprises a process sensitive circuit, a measurement circuit, and a calculation circuit. The method comprises subjecting the semiconductor device to a first operating condition. A first value at a first time for a parameter of the process sensitive circuit is measured by the measurement circuit. The semiconductor device is operated to perform an intended function. A second value at a second time for the parameter of the circuit is measured by the measurement circuit. The second time is different from the first time. A first differential value between the first value and the second value is determined by the calculation circuit.