发明名称 |
LITHOGRAPHIC APPARATUS, METHOD OF CALIBRATING LITHOGRAPHIC APPARATUS, AND METHOD OF MANUFACTURING DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a lithographic apparatus adapted to compensate for a disturbance of mirror surfaces. <P>SOLUTION: The lithographic apparatus includes a system to compensate for an influence of thermal distortion of the substrate table on position measurements of the substrate table using lateral mirrors in the substrate table. Methods of calibrating a lithographic apparatus are presented which are implemented using various scan trajectories of the substrate table and measurements of the local positions and rotations of the lateral mirrors in the substrate table. A dual stage lithographic apparatus is provided with alignment marks to definitely establish the geometric configuration of the lateral mirrors, which are used only in the exposure station, so that the geometric configuration of the lateral mirrors can be measured while the substrate table is in the measurement station. <P>COPYRIGHT: (C)2008,JPO&INPIT |
申请公布号 |
JP2008034845(A) |
申请公布日期 |
2008.02.14 |
申请号 |
JP20070189082 |
申请日期 |
2007.07.20 |
申请人 |
ASML NETHERLANDS BV |
发明人 |
ZAAL KOEN JACOBUS J M;OTTENS JOOST JEROEN;STOELDRAIJER JUDOCUS MARIE DOMINICUS;DE KORT ANTONIUS J;VAN DE MAST FRANCISCUS;DE JONG MARTEIJN |
分类号 |
H01L21/027;H01L21/68 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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