发明名称 Carbon nanotube probe
摘要 <p>A carbon thin line probe having a carbon thin line selectively formed at a projection-like terminal end portion thereof by means of an irradiation of high-energy beam, the carbon thin line internally containing a metal. Thereby achieved is a carbon thin line probe suitable for example for the probe of SPM cantilever, which has a high aspect ratio and high durability and reliability, capability of batch processing based on a simple manufacturing method, and to which magnetic characteristic can be imparted.</p>
申请公布号 EP1830367(A3) 申请公布日期 2008.02.13
申请号 EP20070103380 申请日期 2007.03.02
申请人 OLYMPUS CORPORATION 发明人 MASASHI, KITAZAWA;TATSUHIKO, OKITA;JUNYA, TANAKA;MASAKI, TANEMURA
分类号 C12N15/89;G01Q60/24;G01Q60/38;G01Q60/50;G01Q60/54;G01Q70/00;G01Q70/12 主分类号 C12N15/89
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