发明名称 |
Carbon nanotube probe |
摘要 |
<p>A carbon thin line probe having a carbon thin line selectively formed at a projection-like terminal end portion thereof by means of an irradiation of high-energy beam, the carbon thin line internally containing a metal. Thereby achieved is a carbon thin line probe suitable for example for the probe of SPM cantilever, which has a high aspect ratio and high durability and reliability, capability of batch processing based on a simple manufacturing method, and to which magnetic characteristic can be imparted.</p> |
申请公布号 |
EP1830367(A3) |
申请公布日期 |
2008.02.13 |
申请号 |
EP20070103380 |
申请日期 |
2007.03.02 |
申请人 |
OLYMPUS CORPORATION |
发明人 |
MASASHI, KITAZAWA;TATSUHIKO, OKITA;JUNYA, TANAKA;MASAKI, TANEMURA |
分类号 |
C12N15/89;G01Q60/24;G01Q60/38;G01Q60/50;G01Q60/54;G01Q70/00;G01Q70/12 |
主分类号 |
C12N15/89 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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