发明名称 Test apparatus and test method
摘要 <p>A test apparatus for testing a plurality of devices under test comprises a plurality of control apparatuses (130) for testing the plurality of devices under test in parallel. Each of the plurality of control apparatuses includes: a performance judging test executing section (170) for ordering to perform a performance judging test to the device under test for judging performance of the device under test; an operational specification determination section (180) for determining operational specifications of the device under test based on result of the performance judging test; an acceptability judging test executing section (200) for ordering to perform an acceptability judging test to the device under test according to the operational specifications determined by said operational specification determination section; and an acceptability judgement section (205) for judging acceptability of the device under test according to the operational specifications determined by said operational specification determination section based on the result of the acceptability judging test. </p>
申请公布号 EP1884789(A3) 申请公布日期 2008.02.13
申请号 EP20070075969 申请日期 2004.03.24
申请人 ADVANTEST CORPORATION 发明人 ICHIYOSHI, SELJI
分类号 G01R31/28;G01R31/3183;G01R31/319 主分类号 G01R31/28
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