发明名称 ELECTRON BEAM EXPOSURE METHOD AND ELECTRON BEAM EXPOSURE SYSTEM
摘要 In an electron beam exposure method in which an article subjected to exposure and an electron beam irradiation spot are moved relative to each other at a continuous speed, the article is exposed at a plurality of irradiation intensities of an electron beam by changing a transmittance of an electron optical system for forming the electron beam irradiation spot on the article. <IMAGE>
申请公布号 EP1560071(A4) 申请公布日期 2008.02.13
申请号 EP20030758860 申请日期 2003.10.24
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD 发明人 ITO, EIICHI;TSUKUDA, MASAHIKO
分类号 G03F7/20;G11B7/26;G21K5/04;G21K5/10;H01J37/317;H01L21/027 主分类号 G03F7/20
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