发明名称 |
Electrical characteristic measuring probe and method of manufacturing the same |
摘要 |
In an electrical characteristic measuring probe of the present invention constructed by assembling a plurality of probe parts, each comprising a base portion, a plurality of terminal portions extended outward from one end of the base portion, wiring patterns extended from a plurality of terminal portions onto the base portion respectively, and contact portions connected to the wiring patterns respectively, a plurality of thin plate-like probe parts are aligned such that respective thin-plate surfaces are placed in parallel with each other and the contact portions are directed in the same direction, and a plurality of probe parts and spacers are fixed by fixing means in a state that the spacer is arranged between a plurality of probe parts respectively.
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申请公布号 |
US7330037(B2) |
申请公布日期 |
2008.02.12 |
申请号 |
US20040980162 |
申请日期 |
2004.11.04 |
申请人 |
SHINKO ELECTRIC INDUSTRIES CO., LTD |
发明人 |
KOIZUMI NAOYUKI;SHIRAISHI AKINORI;MURAYAMA KEI |
分类号 |
G01R31/02;G01R1/06;G01R1/067;G01R1/073;G01R3/00;H01L21/66 |
主分类号 |
G01R31/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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