发明名称 Nitride-based compound semiconductor electron device including a buffer layer structure
摘要 A GaN-based FET has a buffer layer structure including GaN first buffer layer and an AlGaN second buffer layer between a substrate and an active layer structure including a channel layer and a donor layer. The GaN first buffer layer and the AlGaN second buffer layer reduce dislocation defects in the active layer structure and allows the FET to have a lower leakage current and a satisfactory pinch-off characteristic. A plurality of GaN first buffer layers and a plurality of AlGaN second buffer layers may be deposited alternately one on another on the substrate.
申请公布号 US7329908(B2) 申请公布日期 2008.02.12
申请号 US20040812947 申请日期 2004.03.31
申请人 THE FURUKAWA ELECTRIC CO., LTD. 发明人 YOSHIDA SEIKOH
分类号 H01L29/812;H01L31/072;H01L21/338;H01L29/15;H01L29/20;H01L29/778;H01L31/0328;H01L31/0336;H01L31/109 主分类号 H01L29/812
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