| 摘要 |
The present invention provides a test card for multiple functions testing. The test card includes a host of media devices, all of which reside on a single printed circuit board; and a selection device which selects each one of the host of media devices for testing. The test card can test all SD, MMC, MS (Pro), SMC devices and functions in one time in a bench without inserting and removing the media devices, thus accelerates the production line test speed. |
