发明名称 Spectrophotometric system with reduced angle of incidence
摘要 A system uses reflectance spectrophotometry to characterize a sample having any number of structures. The system uses toroidal mirrors that are shaped in such a way that the angle of reflectance off of the target is small. The small angle of reflectance may allow for simplification of calculations and can result in a faster processing time. In addition, a more accurate measurement can be achieved when the reflected beam is close to normal.
申请公布号 US7330256(B1) 申请公布日期 2008.02.12
申请号 US20050130638 申请日期 2005.05.16
申请人 N&K TECHNOLOGY, INC. 发明人 AHO MARC;FOROUHI ABDUL RAHIM
分类号 G01J3/42 主分类号 G01J3/42
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