发明名称 ANTI-FUSE MEMORY DEVICE
摘要 <p>A One Time Programmable (OTP) memory cell (10) comprising a first, metallic layer (12) coated with a second, conductive stable transition compound (14) with an insulating layer (16) there-between. The first and second layers (12, 14) are selected according to the difference in Gibbs Free Energy between them, which dictates the chemical energy that will be generated as a result of an exothermic chemical reaction between the two materials. The materials of the first and second layers (12, 14) are highly thermally stable in themselves but, when a voltage is applied to the cell (10), a localized breakdown of the insulative layer (16) results which creates a hotspot (18) that sets off an exothermic chemical reaction between the first and second layers (12, 14). The exothermic reaction generates sufficient heat (20) to create a short circuit across the cell and therefore reduce the resistance thereof.</p>
申请公布号 KR20080012989(A) 申请公布日期 2008.02.12
申请号 KR20077029981 申请日期 2007.12.21
申请人 NXP B.V. 发明人 VAN DER SLUIS PAUL;MIJIRITSKII ANDREI;WOERLEE PIERRE H.;VAN ACHT VICTOR M. G.;LAMBERT NICOLAAS
分类号 H01L27/115 主分类号 H01L27/115
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