SEMICONDUCTOR MEMORY DEVICE FOR PREVENTING SUPPLY OF EXCESSING SPECIFIC STRESS ITEM AND TEST METHOD THEREOF

摘要

A semiconductor memory device for preventing supply of excessive specific stress item and a test method thereof are provided to cut off power supply when the excessive specific stress item is applied. A memory core(130) receives specific stress item and pattern item from the outside. A switch part(120) supplies a power supply voltage provided from the outside to the memory core. A switch control part(110) controls the switch part. The memory core tests stability in response to the specific stress item, and the switch control part interrupts the switch part when the specific stress item is applied to the memory core more than twice.