| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit device for preventing upsizing due to provision of a fault position analysis circuit. SOLUTION: The semiconductor integrated circuit device comprises: scan path circuits SC1-SCn provided corresponding to storage sections RM1-RMn in a one-to-one relationship; an OR circuit OR1 for performing OR operation by receiving serial data SO1-SOn outputted from the scan path circuits SC1-SCn; and the fault position analysis circuit ENC for receiving OR operation output. In the fault position analysis circuit ENC, fault position information FAIL_POSI and a fail flag FAIL_FLAG are outputted based on the OR operation output. COPYRIGHT: (C)2008,JPO&INPIT
|
