发明名称 COPPER DAMASCENE PROCESS
摘要 A copper damascene process includes providing a substrate having a dielectric layer thereon, forming at least a copper damascene structure in the dielectric layer, performing a heat treatment on the substrate, and performing a reduction plasma treatment on a surface of the copper damascene structure. The impurities formed in the copper damascene process are removed by the heat treatment, therefore the copper damascene structure is completely reduced by the reduction plasma treatment and is improved.
申请公布号 US2008026579(A1) 申请公布日期 2008.01.31
申请号 US20060459931 申请日期 2006.07.25
申请人 LAI KUO-CHIH;CHEN MEI-LING;CHEN JEI-MING;CHEN HSIN-HSING;SU SHIH-FENG;CHEN MENG-CHI 发明人 LAI KUO-CHIH;CHEN MEI-LING;CHEN JEI-MING;CHEN HSIN-HSING;SU SHIH-FENG;CHEN MENG-CHI
分类号 H01L21/44 主分类号 H01L21/44
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