| 摘要 |
Provided are a suplatast tosilate crystal showing characteristic peaks in powder X-ray diffraction at diffraction angles (2&thetas; +/- 0.1 DEG ) of 5.6 DEG , 9.0 DEG , 11.0 DEG , 15.3 DEG , 16.5 DEG , 17.2 DEG , 17.9 DEG , 19.2 DEG , 19.9 DEG and 21.5 DEG ; and a preparation process of the crystal. Owing to merits such as a fluctuation-free optically active substance ratio, low hygroscopicity and high storage stability, the suplatast tosilate crystal of the present invention can be mass produced easily and at the same time, is advantageous in drug preparation or quality management. It is thus excellent as a raw material for pharmaceuticals. |
