发明名称 |
Termination structure, a mask for manufacturing a termination structure, a lithographic process and a semiconductor device with a termination structure |
摘要 |
Termination structure for a pattern, especially an at least partially regular spaced pattern used in the manufacturing of semiconductor devices, especially DRAM-chips, wherein the termination structure comprises at least a first line-shaped element and at least one extension element adjacent to the first line-shaped element partially increasing the width of the first line-shaped element.
|
申请公布号 |
US2008028359(A1) |
申请公布日期 |
2008.01.31 |
申请号 |
US20060496279 |
申请日期 |
2006.07.31 |
申请人 |
BLAWID STEFAN;KOESTLER WOLFRAM;ZIEBOLD RALF |
发明人 |
BLAWID STEFAN;KOESTLER WOLFRAM;ZIEBOLD RALF |
分类号 |
G06F17/50 |
主分类号 |
G06F17/50 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|