发明名称 Termination structure, a mask for manufacturing a termination structure, a lithographic process and a semiconductor device with a termination structure
摘要 Termination structure for a pattern, especially an at least partially regular spaced pattern used in the manufacturing of semiconductor devices, especially DRAM-chips, wherein the termination structure comprises at least a first line-shaped element and at least one extension element adjacent to the first line-shaped element partially increasing the width of the first line-shaped element.
申请公布号 US2008028359(A1) 申请公布日期 2008.01.31
申请号 US20060496279 申请日期 2006.07.31
申请人 BLAWID STEFAN;KOESTLER WOLFRAM;ZIEBOLD RALF 发明人 BLAWID STEFAN;KOESTLER WOLFRAM;ZIEBOLD RALF
分类号 G06F17/50 主分类号 G06F17/50
代理机构 代理人
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