| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an optical main axis distribution measuring method which enables the precise and simple measurement of the optical main axis distribution of a polarization layer with respect to an optical laminate constituted of a laminate of the polarization layer consisting of a double refractive material and a visible light shielding layer, and to provide an optical main axis distribution measuring device. <P>SOLUTION: In an optical main axis distribution measuring method for calculating the optical main axis distribution in the polarization layer 35 with respect to the optical laminate 19 having the laminated structure of the polarization layer 35 and the visible light shielding layer 31, infrared rays, which contain the absorption peak wavelength band of the polarization layer 35 and is transmitted through another layer are set to a linear polarized light in a specific polarization direction to irradiate the optical laminate 19 and the quantity of the transmitted light from the optical laminate 19 irradiated with infrared rays is measured to calculate the optical main axis of the polarization layer 35 on the basis of the quantity value of transmitted light and the linear polarization direction of infrared rays. <P>COPYRIGHT: (C)2008,JPO&INPIT |
