发明名称 Semiconductor Devices and Methods of Fabricating the Same
摘要 Provided are semiconductor devices and methods of fabricating the semiconductor devices. Embodiments of such methods may include sequentially forming a gate insulation layer and a metal layer on a semiconductor substrate and etching the metal layer to form a metallic residue on the gate insulation layer. Such methods may also include monitoring an etch by-product to detect an etch endpoint for stopping the etching and forming a polysilicon layer on the gate insulation layer including the metallic residue.
申请公布号 US2008023765(A1) 申请公布日期 2008.01.31
申请号 US20070756122 申请日期 2007.05.31
申请人 SAMSUNG ELECTRONICS COMPANY, LTD. 发明人 JEON TAEK-SOO;KANG IN-SANG;KANG SANG-BOM;PARK HONG-BAE;CHO HAG-JU;LEE HYE-LAN
分类号 H01L27/01;H01L21/00 主分类号 H01L27/01
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