发明名称 |
Semiconductor Devices and Methods of Fabricating the Same |
摘要 |
Provided are semiconductor devices and methods of fabricating the semiconductor devices. Embodiments of such methods may include sequentially forming a gate insulation layer and a metal layer on a semiconductor substrate and etching the metal layer to form a metallic residue on the gate insulation layer. Such methods may also include monitoring an etch by-product to detect an etch endpoint for stopping the etching and forming a polysilicon layer on the gate insulation layer including the metallic residue.
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申请公布号 |
US2008023765(A1) |
申请公布日期 |
2008.01.31 |
申请号 |
US20070756122 |
申请日期 |
2007.05.31 |
申请人 |
SAMSUNG ELECTRONICS COMPANY, LTD. |
发明人 |
JEON TAEK-SOO;KANG IN-SANG;KANG SANG-BOM;PARK HONG-BAE;CHO HAG-JU;LEE HYE-LAN |
分类号 |
H01L27/01;H01L21/00 |
主分类号 |
H01L27/01 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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