Switch spring contact pin for use in testing apparatus, has housing, contact lug, retainer and probe head that are provided with inner recess, where recess is guided till head is in use position, and optical fiber is penetrated into recess

摘要

The contact pin (1) has a probe head (3), which is movable in a housing against force of a spring (2), where the contact pin is exchangeably positioned in a shaft (4) of the probe head. A contact spring retainer (5) has a contact lug (6) for contacting an interior of the housing, where the lug is provided at an end of the probe head and the end points into the interior of the housing. The housing, the lug, the retainer and the probe head are provided with an inner recess (7), which is guided till the probe head is in a use position, and an optical fiber is penetrated into the recess.