发明名称 |
PROTECTIVE CIRCUIT AGAINST ELECTROSTATIC DISCHARGE DAMAGE |
摘要 |
PROBLEM TO BE SOLVED: To provide a protective circuit against electrostatic discharge damage with improved performance (operating speed and resistance to electrostatic discharge damage) for protecting an internal circuit against surge voltage such as static electricity. SOLUTION: An n-channel MOS transistor 5 is connected between a wire 3 and a VSS (ground voltage) wire 4. A first capacitor 6 is connected between the wire 3 and the gate of the MOS transistor 5, and a second capacitor 7 is connected between the VSS wire 4 and the gate. A voltage applied to an input/output terminal 2 is divided by these capacitance elements, and a corresponding divided voltage is applied to the gate. When a surge occurs, the MOS transistor 5 is forced to be turned ON by the divided voltage to make current flow, thereby protecting the internal circuit 1. A parasitic bipolar transistor is turned ON against a further excessive surge. A Zener diode 8 is provided between the gate and the VSS wire 4 to prevent the voltage applied to the gate from rising to a predetermined or higher voltage. COPYRIGHT: (C)2008,JPO&INPIT
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申请公布号 |
JP2008021735(A) |
申请公布日期 |
2008.01.31 |
申请号 |
JP20060190686 |
申请日期 |
2006.07.11 |
申请人 |
SANYO ELECTRIC CO LTD;SANYO SEMICONDUCTOR CO LTD |
发明人 |
OTAKE SEIJI;KIKUCHI SHUICHI;OISHIBASHI YASUO;SEKI MASAO;NISHI TOMOAKI |
分类号 |
H01L21/822;H01L21/8234;H01L27/04;H01L27/06;H01L27/088 |
主分类号 |
H01L21/822 |
代理机构 |
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