| 摘要 |
Methods and apparatuses for quantifying the similarity between nodes in a plurality of electronic classification schemes are disclosed according to some aspects. In one embodiment, quantification of the similarity between a first node in a first electronic classification scheme and a second node in a second electronic classification scheme comprises finding a third node among those in the first electronic classification scheme, wherein a first product value of an inter-scheme similarity value between the second and third nodes and an intra-scheme similarity value between the first and third nodes is a maximum. It further comprises finding a fourth node among those in the second electronic classification scheme, wherein a second product value of an inter-scheme similarity value between the first and fourth nodes and an intra-scheme similarity value between the second and fourth nodes is a maximum. The maximum between the first and second product values represents a measure of similarity between the first and second nodes.
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