MODULE AND METHOD FOR DETECTING DEFECT OF THIN FILM TRANSISTOR SUBSTRATE

摘要

A module and a method for detecting a defect of a thin film transistor substrate are provided to separate gate lines into two parts and drive stage parts formed at both sides of the gate lines to detect gate line disconnection, and supply a negative voltage level signal to data lines to improve the capability of detecting gate line disconnection. A data signal generator(1100) supplies data signals for a test to a plurality of data lines(D1-D2m) of a thin film transistor substrate(100). An operation signal generator(1200) is formed on the thin film transistor substrate for supplying operation signals to first and second gate driving units(201,202) formed at both side areas of a plurality of gate lines. An inspecting unit(1300) measures a voltage level of pixel electrodes on the thin film transistor substrate.