发明名称 Surface inspection apparatus and surface inspection method
摘要 A surface inspection apparatus comprises a radiation mechanism for radiating a light beam to the surface of an object having an edge of a non-flat surface (for example, a rounded edge) or an edge of an inclined surface, a scanning mechanism for moving the object relative to a radiation position of the light beam for scanning, and a detector for detecting light scattered from the object, and further includes the following characteristic. The scanning mechanism, when the light beam for scanning is radiated to the edge of the object, is configured to move the object in the direction that increases an incident angle of the light beam with a normal to the surface of the edge as the objection moves relative to a radiation position of the light beam.
申请公布号 US2008024773(A1) 申请公布日期 2008.01.31
申请号 US20070711863 申请日期 2007.02.28
申请人 MIYAZAKI YUSUKE;ONO TAKAYUKI;JINGU TAKAHIRO;KOMEDA KENICHIRO;ZAMA KAZUHIRO 发明人 MIYAZAKI YUSUKE;ONO TAKAYUKI;JINGU TAKAHIRO;KOMEDA KENICHIRO;ZAMA KAZUHIRO
分类号 G01N21/88 主分类号 G01N21/88
代理机构 代理人
主权项
地址