发明名称 Semiconductor device including a germanium silicide film on a selective epitaxial layer
摘要 A process for manufacturing a semiconductor device includes: forming first contact holes in a dielectric film for a PMOS transistor; depositing germanium on the source/drain regions of the PMOS transistor exposed from the first contact holes; heat treating the germanium with silicon in the source/drain regions of the PMOS transistor to form a germanium silicide film; forming second contact holes in the dielectric film for the source/drain regions of the NMOS transistor; and forming contact plugs in the first and second contact holes.
申请公布号 US2008023772(A1) 申请公布日期 2008.01.31
申请号 US20070878294 申请日期 2007.07.23
申请人 ELPIDA MEMORY, INC. 发明人 KAWAKITA KEIZO
分类号 H01L21/8238;H01L29/94 主分类号 H01L21/8238
代理机构 代理人
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