发明名称 SIGNAL PROCESS DEVICE AND TESTER FOR SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To inhibit the device cost from increasing and to intend to reduce the test time. SOLUTION: The signal process device comprises: a first occurrence point of time detection means for outputting a first occurrence point of time signal representing the occurrence point of time of a first signal by inputting the first signal; the second occurrence point of time detection means for outputting the second occurrence point of time signal representing the occurrence point of time of the second signal by inputting the second signal asynchronous to the first signal; a selection means having a first mode for selectively outputting the first signal and the first occurrence point of time signal, and the second mode for selectively outputting the second signal and the second occurrence point of time signal by inputting the first signal and the first occurrence point of time signal, and the second signal and the second occurrence point of time signal. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008020238(A) 申请公布日期 2008.01.31
申请号 JP20060190284 申请日期 2006.07.11
申请人 YOKOGAWA ELECTRIC CORP 发明人 SATO HIROYA
分类号 G01R31/319 主分类号 G01R31/319
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