发明名称 TERAHERTZ WAVE RESPONSE MEASURING DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To solve the problems wherein, in the case where an optical path length is not scanned at equal speed, accuracy is lowered and a long measuring time is required, because interpolation processing of measured data is necessary in a conventional rapid scan system. <P>SOLUTION: A laser interferometer 8 is attached to an optical path length scanning part 6 for changing the optical path length of an optical path from a laser light source 1 to a transmission part (terahertz light source) 9, and a pulse signal 15 is generated at each fixed displacement interval, and a polarity signal 16 showing the moving direction is generated. Both signals 15, 16 are delayed by delay parts 17, 18 as much as a time delay portion in an analog electric circuit, to thereby allow each timing to agree with each other. A sample/hold circuit 20 samples a detection signal of a reception part 12 synchronously with a pulse signal 15', and it is converted into a digital value by an A/D conversion part 21, hereby, measured data at every fixed displacement intervalΔL can be acquired accurately. <P>COPYRIGHT: (C)2008,JPO&INPIT</p>
申请公布号 JP2008020268(A) 申请公布日期 2008.01.31
申请号 JP20060191030 申请日期 2006.07.12
申请人 SHIMADZU CORP 发明人 TAKUBO KENJI
分类号 G01N21/35;G01N21/3586 主分类号 G01N21/35
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