发明名称 APPARATUS FOR INSPECTING BACK LIGHT UNIT
摘要 An apparatus for testing a back light unit is provided to integrate a signal generator for generating a test signal with a power supply unit to test an automatic color calibration function rapidly and easily, thereby improving productivity. An apparatus for testing a back light unit includes a power supply unit(110) and a signal generator(100). The power supply unit supplies power to an LED(Light Emitting Diode) back light unit. The signal generator generates an IIC(Inter IC) signal for controlling the LED back light unit. The power supply unit includes a switching mode power supply. The signal generator includes a microcomputer(102) for generating the IIC signal and a memory(104) for storing predetermined data. The apparatus further includes a switching unit(120) for controlling the power supply unit and the signal generator. The apparatus further includes a first connector(130a) for connecting the power supply unit to the LED back light unit and a second connector(130b) for connecting the signal generator to the LED back light unit.
申请公布号 KR20080009378(A) 申请公布日期 2008.01.29
申请号 KR20060068876 申请日期 2006.07.24
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI, MIN SOO;GHO, JAE SEOK;PARK, JUNG WOOK
分类号 G02F1/13 主分类号 G02F1/13
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