发明名称 Forming high-k dielectric layers on smooth substrates
摘要 A buffer layer and a high-k metal oxide dielectric may be formed over a smooth silicon substrate. The substrate smoothness may reduce column growth of the high-k metal oxide gate dielectric. The surface of the substrate may be saturated with hydroxyl terminations prior to deposition.
申请公布号 US7323423(B2) 申请公布日期 2008.01.29
申请号 US20040882734 申请日期 2004.06.30
申请人 INTEL CORPORATION 发明人 BRASK JUSTIN K.;KAVALIEROS JACK;DOCZY MARK L.;METZ MATTHEW V.;DATTA SUMAN;SHAH UDAY;DEWEY GILBERT;CHAU ROBERT S.
分类号 H01L21/31;H01L21/469 主分类号 H01L21/31
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