TEST APPARATUS FOR DETECTING THE SYSTEM FAIL AND TEST METHOD THEREOF

摘要

A mounting test apparatus for detecting system fail and a test method thereof are provided to detect accurate information of a memory chip causing an error as reducing mounting test cost and time in a system level, by testing a plurality of memory modules in parallel at the same time. A main board comprises at least more than two memory modules as including a first and a second memory module(130,120) including a number of memory chips(132,134,136,138). A test unit(150) performs test by connecting corresponding memory chips of each module. The test unit connects or disconnects the corresponding memory chips.