发明名称 |
PROBE BEAM MOLD FOR REPAIRING PROBE BEAM OF PROBE CARD AND PROBE REPAIR SYSTEM USING THE SAME |
摘要 |
A probe beam mold for repairing a probe card and a probe repair system using the same are provided to easily replace a damaged probe beam by a new probe beam by using a transparent substrate and a fusing beam. A probe beam mold includes a guide plate(200) having at least one slot(210) corresponding to a pitch of a probe beam and receiving a repair probe beam, and a transparent substrate(230) attached to a front surface of the guide plate, through which a beam for fusing the repair probe beam passes. The guide plate includes a silicon substrate, and the transparent plate includes at least one of a glass substrate and a quartz substrate.
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申请公布号 |
KR100798298(B1) |
申请公布日期 |
2008.01.28 |
申请号 |
KR20070015354 |
申请日期 |
2007.02.14 |
申请人 |
UNITEST INC. |
发明人 |
KIM, BONG HWAN;KIM, JONG BOK;KUM, BYUNG HOON;KIM, JIN MYUNG |
分类号 |
H01L21/66;G01R1/067 |
主分类号 |
H01L21/66 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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