发明名称 PROBE BEAM MOLD FOR REPAIRING PROBE BEAM OF PROBE CARD AND PROBE REPAIR SYSTEM USING THE SAME
摘要 A probe beam mold for repairing a probe card and a probe repair system using the same are provided to easily replace a damaged probe beam by a new probe beam by using a transparent substrate and a fusing beam. A probe beam mold includes a guide plate(200) having at least one slot(210) corresponding to a pitch of a probe beam and receiving a repair probe beam, and a transparent substrate(230) attached to a front surface of the guide plate, through which a beam for fusing the repair probe beam passes. The guide plate includes a silicon substrate, and the transparent plate includes at least one of a glass substrate and a quartz substrate.
申请公布号 KR100798298(B1) 申请公布日期 2008.01.28
申请号 KR20070015354 申请日期 2007.02.14
申请人 UNITEST INC. 发明人 KIM, BONG HWAN;KIM, JONG BOK;KUM, BYUNG HOON;KIM, JIN MYUNG
分类号 H01L21/66;G01R1/067 主分类号 H01L21/66
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