| 摘要 |
The invention relates to a scanning apparatus (1) for the contour measurement of objects, in particular of structure clearances, comprising at least one light source and at least one deflection device (2), which deflection device (2) is arranged in a housing part (3) that can be rotated about an axis of rotation, and which deflection device directs a scanning beam coming from the light source as transmission beam (6) onto an object to be measured and directs light components reflected from the object as reception beam (10) in the direction of a detector of a recording device. For operating the scanning apparatus with reduced losses, wear and disturbances, it is provided that the housing part (3) is arranged fixedly in terms of rotation on a supporting member (4), which reaches through said housing part along the axis of rotation and is mounted outside the housing part, and that the supporting member (4) is provided with a separate deflection device (5) for the transmission beam (6). |
