发明名称 SIGNAL INSPECTION APPARATUS
摘要 A signal inspection apparatus is provided to prevent a test pin from being broken by aligning signal ports and the test pin more accurately. A signal inspection apparatus(100) includes a fixed plate(130). A number of test pins(110) are fixed on the fixed plate, and are electrically connected to signal ports included a port socket of an electronic device. A protection plate(120) is vertically arranged to the length direction of the test pin, and has first aperture passing the test pins. An elastic member(140) is arranged between the protection plate and the fixed plate, and applies elastic force to the protection plate. A guide pin(150) guides the signal ports among the test pins. A signal inspection part(160) is connected to the test pins, and inspects the electronic device by applying a driving signal to the test pins.
申请公布号 KR20080008462(A) 申请公布日期 2008.01.24
申请号 KR20060067736 申请日期 2006.07.20
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, TAE KYUNG;LEE, DONG HWAN;JEE, AHN HO;KIM, TAE HUN;LEE, CHUL HWAN;KANG, SOO MYEONG;KIM, YOUNG MAN
分类号 G01R1/06;G01R31/28;G02F1/13 主分类号 G01R1/06
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