发明名称 CHARACTERISTICS MEASURING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a characteristics measuring apparatus which, when some abnormalities have occurred in a measuring tool or the like, can detect the abnormalities at an early stage and efficiently. SOLUTION: Electronic components manufactured from the same lot are separately supplied to a plurality of measuring lines L1, L2, L3, or the like. The measuring tool 12 is electrically connected to an external electrode of the electronic component to apply measuring voltage, while the electrical characteristics of the electronic component are measured by a measuring instrument 14, the measuring line abnormality detection section 18 decides, when the difference between the measured values in a certain range from the measuring lines L1, L2, L3, or the like, exceeds a predetermined threshold, that an abnormality has occurred in either measuring line. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008014718(A) 申请公布日期 2008.01.24
申请号 JP20060184727 申请日期 2006.07.04
申请人 MURATA MFG CO LTD 发明人 ASAKAWA KEIJI;TAKEUCHI HARUYUKI
分类号 G01R31/00 主分类号 G01R31/00
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