发明名称 METHOD AND APPARATUS FOR DETECTING STAIN DEFECTS
摘要 <P>PROBLEM TO BE SOLVED: To provide a method and an apparatus for detecting stain defects which can accurately detect stain defects; without misdetecting. <P>SOLUTION: In the method, a stain defect enhancing filter enhances the stain defects, surrounded by luminance comparison pixels S1-S32, based on the average of luminance differences between an object pixel O and two luminance comparison pixels which are set on point-symmetry positions. Here that the filter straddles to the interior and exterior portions of a panel image area Rp, is decided by using a second condition and a third condition. In such a case, the luminance difference between the object pixel O and one of the set of luminance comparison pixels, existing in the same area as the object pixel O, is used as an enhanced calculation value for enhancing the stain defects, thereby preventing misdetections from being conducted with misdetecting the presence of stain defects, which is caused by the luminance difference between the interior and the exterior portions of the panel image area Rp. Since processing and the like for extracting only the panel image area Rp from a photographed image can be dispensed with, by applying two or more conditions such as these, the processing is simplified and its inspection time is shortened. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008014842(A) 申请公布日期 2008.01.24
申请号 JP20060187181 申请日期 2006.07.06
申请人 SEIKO EPSON CORP 发明人 KOJIMA KOICHI
分类号 G01N21/88;G01M11/00;G02F1/13;G06T1/00 主分类号 G01N21/88
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