发明名称 APPARATUS AND METHOD FOR EVALUATING ORGANIC MATERIAL
摘要 PROBLEM TO BE SOLVED: To know defect information or the like inside an organic material. SOLUTION: An evaluation apparatus includes: monochromatic light application unit 26 which applies a monochromatic light of a given wavelength to an organic device at given timing and intensity; voltage pulse generation unit 20 which applies voltage at given timing and voltage strength; and an impedance measurement unit 22 which detects impedance of the organic material at a given timing. An apparatus control unit 40 controls conditions and measurement in the respective units thereof, and detects the correspondence between the applied monochromatic light and the applied pulse voltage. For example, the invention enables to evaluate a deep level due to a defect level or the like within a band gap of the organic material by obtaining variation of capacitance of the organic material with respect to the energy of an incident light, resulting in enabling to evaluate properties and reliability of the device. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008014668(A) 申请公布日期 2008.01.24
申请号 JP20060183587 申请日期 2006.07.03
申请人 TOYOTA CENTRAL RES & DEV LAB INC 发明人 NAKANO YOSHITAKA;NODA KOJI;FUJIKAWA HISAYOSHI;MORIKAWA KENJI;OWAKI TAKESHI
分类号 G01N27/02;G01N27/22;H01L51/50;H05B33/10 主分类号 G01N27/02
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