| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit testing device and a method therefor which can achieve a reduction in testing time. SOLUTION: The semiconductor integrated circuit testing device performs the test by applying a command signal in parallel to a plurality of object devices to be tested, and is equipped with: a device condition judging means for judging the condition of each object device to be tested, in accordance with signals output from each object device to be tested; a counting means for counting the number of times of generation of prescribed condition after a lapse of predetermined period for each object device to be tested, in accordance with the result of the judgment made by the device condition judging means; and a command control means for determining as an out-of-test object, such an object device that the above number of times coincides with a set value and for controlling a timing to apply the above command signal in accordance with the condition of other object devices to be tested except the object device to be tested determined as the out-of-test object. COPYRIGHT: (C)2008,JPO&INPIT
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