发明名称 FAILURE ANALYSIS SUPPORT DEVICE, FAILURE ANALYSIS SUPPORT METHOD, FAILURE ANALYSIS SUPPORTING PROGRAM, AND RECORDING MEDIUM RECORDING FAILURE ANALYSIS SUPPORTING PROGRAM
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a failure analysis support device capable of efficient analysis of causes for a failure. <P>SOLUTION: In extracting a failure part, a range of the degree of abruptness one desires to extract is first designated (S21). As a method for designating the range, something abnormal more than a threshold value or not abnormal is designated. Ranges are divided in advance and a selection may be made out of them. Then, within the designated range, a pareto chart is created (S22). On the basis of the created pareto chart, a failure is extracted (S23) and its causes are analyzed (S24). <P>COPYRIGHT: (C)2008,JPO&INPIT</p>
申请公布号 JP2008015663(A) 申请公布日期 2008.01.24
申请号 JP20060184379 申请日期 2006.07.04
申请人 OMRON CORP 发明人 KISHIMOTO MAYUKO;SOMA KOJI;MORI HIROYUKI
分类号 G05B19/418 主分类号 G05B19/418
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