发明名称 Magnetically enhanced, inductively coupled plasma source for a focused ion beam system
摘要 The present invention provides an inductively coupled, magnetically enhanced ion beam source, suitable to be used in conjunction with probe-forming optics to produce an ion beam without kinetic energy oscillations induced by the source.
申请公布号 US2008017319(A1) 申请公布日期 2008.01.24
申请号 US20070825136 申请日期 2007.07.02
申请人 FEI COMPANY 发明人 KELLER JOHN;SMITH NOEL;BOSWELL RODERICK;SCIPIONI LAWRENCE;CHARLES CHRISTINE;SUTHERLAND ORSON
分类号 H01J27/02;C23C16/00;H01J37/08 主分类号 H01J27/02
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