发明名称 POSITIVE RESIST COMPOSITION AND RESIST PATTERN FORMING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a positive resist composition capable of suppressing pattern collapse of a resist pattern of a narrow pitch and a resist pattern forming method. <P>SOLUTION: The positive resist composition comprises a resin component (A) having an acid-dissociable dissolution inhibiting group and alkali solubility increased by the action of an acid and an acid generator component (B) which generates an acid upon exposure to light, wherein the acid generator component (B) comprises an onium salt (B1) having an anionic moiety represented by the formula (I): R<SP>4</SP>-SO<SB>3</SB><SP>-</SP>(wherein R<SP>4</SP>represents a 3C fluoroalkyl group) and at least one acid generator (B2) selected from the group consisting of an onium salt (B2-1) having an anionic moiety containing no fluorine atom and a nonionic acid generator (B2-2) containing no fluorine atom. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008015247(A) 申请公布日期 2008.01.24
申请号 JP20060186620 申请日期 2006.07.06
申请人 TOKYO OHKA KOGYO CO LTD 发明人 SHIMIZU HIROAKI;UCHIUMI YOSHIYUKI
分类号 G03F7/004;G03F7/039;H01L21/027 主分类号 G03F7/004
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