| 摘要 |
PROBLEM TO BE SOLVED: To provide an X-ray diffraction determination apparatus based on a base standard absorption diffraction method that can produce stable reproducible measurement data by improving a baseplate. SOLUTION: The X-ray diffraction determination apparatus using a base standard absorption diffraction method computes the absorption of X-rays by a substance S from the intensity of diffracted rays diffracted by the baseplate 31 in the absence of the substance S and the intensity of diffracted rays diffracted by the baseplate 31 after transmission through the substance S, and corrects the weight of the substance S measured with X-rays in accordance with the computed X-ray absorption. The apparatus has a filter 33 for holding the substance S, an X-ray source F for generating X-rays radiated to the substance S, an X-ray detector 20 for detecting diffracted X-rays diffracted by the substance S, and the baseplate 31 arranged on the opposite side of the filter 33 to the X-radiation surface. The X-radiation surface of the baseplate 31 is subjected to treatment for reducing crystal orientation, such as sandblasting or shot peening. COPYRIGHT: (C)2008,JPO&INPIT
|
