发明名称 CRYOSTAT, SAMPLE MOUNTING APPARATUS, AND TEMPERATURE CONTROL METHOD
摘要 PROBLEM TO BE SOLVED: To provide a cryostat for measuring the temperature over a range, extending from ultralow temperature of approximately 20mK or higher to a room temperature or higher, operating continuously, being manufactured and maintained at low cost, avoiding quenching and being miniaturized, and to provide a sample-mounting apparatus for quick and easy mounting/replacing of sample, and a temperature control method. SOLUTION: The sample-mounting apparatus 5 is mounted to externally and detachably a low-temperature stage 9 in a vacuum atmosphere, and makes the temperature of the sample 31 increased locally by using a heater provided to the sample-mounting apparatus 5. The cryostat and the temperature control method are provided with the sample-mounting apparatus 5, directly bringing a sample holder 30 into contact with the low-temperature stage 9 and thermally coupling them at a first temperature-controlled level, thermally coupling the sample holder 30 to the low-temperature stage 9 via an attachment/detachment section at a second temperature level, and thermally decoupling the attachment/detachment section from the low-temperature stage 9 and disconnecting the thermal coupling at a third second temperature level. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008014878(A) 申请公布日期 2008.01.24
申请号 JP20060188676 申请日期 2006.07.07
申请人 KYUSHU UNIV 发明人 YAYAMA HIDEKI
分类号 G01N1/28;F25B9/00 主分类号 G01N1/28
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