| 发明名称 |
METHODS AND APPARATUS FOR DATA ANALYSIS |
| 摘要 |
A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically identify a characteristic of a fabrication process for components based on test data for the components.
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| 申请公布号 |
US2008021677(A1) |
申请公布日期 |
2008.01.24 |
| 申请号 |
US20070692021 |
申请日期 |
2007.03.27 |
| 申请人 |
BUXTON PAUL M;TABOR ERIC P;MARTIN EMILIO M;ZALZALA ALI M |
发明人 |
BUXTON PAUL M.;TABOR ERIC P.;MARTIN EMILIO M.;ZALZALA ALI M. |
| 分类号 |
G06F15/00;G06F15/76 |
主分类号 |
G06F15/00 |
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