发明名称 APPARATUS FOR PLASMA PROCESS
摘要 A plasma processing apparatus is provided to load a wafer on a proper position of a pedestal by installing a sensing unit at a periphery of the pedestal. A chamber(110) is formed to perform a wafer process. A pedestal(140) is arranged at a lower of the chamber. A wafer(W) is loaded on the pedestal. One and more or two and more sensing units(150) are positioned along a periphery of the pedestal. The sensing units sense an edge of one side of the wafer and detect whether an edge of the other side of the wafer is positioned on the pedestal. A plasma processing apparatus has a relationship of r2 >r1 when the pedestal has a diameter of r1 and the wafer has a diameter of r2.
申请公布号 KR20080007930(A) 申请公布日期 2008.01.23
申请号 KR20060067184 申请日期 2006.07.19
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, SONG HAK
分类号 H01L21/3065;H01L21/205 主分类号 H01L21/3065
代理机构 代理人
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