发明名称 |
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
<p>A semiconductor device and a method for manufacturing the same are provided to reduce a degree of difficulty in a lithography by implanting impurity ions into a desired part of a second hard mask. A first hard mask is formed on an etching member. A second hard mask(40B) is formed on the first hard mask. Ions are implanted into a part of the second hard mask and a modification process is performed to vary an etch rate for wet etching in comparison with a non-ion-implanted part. The first hard mask is etched by using the second hard mask as a mask. The non-ion-implanted part of the second hard mask is removed by performing a selective etch process. A sidewall layer(70) is formed on a sidewall of the first hard mask. A selective etch process is performed to remove an exposed top part of the first hard mask which is not covered with the second hard mask.</p> |
申请公布号 |
KR20080008257(A) |
申请公布日期 |
2008.01.23 |
申请号 |
KR20070071083 |
申请日期 |
2007.07.16 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
KITO MASARU;SATO MITSURU;NAGATA YUZO;HASHIMOTO KOJI |
分类号 |
H01L21/3063;H01L21/027 |
主分类号 |
H01L21/3063 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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