发明名称 PLASMA DOPING METHOD AND PLASMA DOPING APPARATUS
摘要 <p>Disclosed is a plasma doping method that, even though a plasma doping treatment is repeated, can make a dose from a film to a silicon substrate uniform for each time. According to an embodiment of the invention, there is provided a plasma doping method that places a sample on a sample electrode in a vacuum chamber, generates plasma in the vacuum chamber, and causes impurity ions in the plasma to collide against a surface of the sample so as to form an impurity doped layer in the surface of the sample. The plasma doping method includes a maintenance step of preparing the vacuum chamber having a film containing an impurity formed on an inner wall thereof such that, when the film containing the impurity fixed to the inner wall of the vacuum chamber is attacked by ions in the plasma, the amount of an impurity to be doped into the surface of the sample by sputtering is not changed even though the plasma containing the impurity ions is repeatedly generated in the vacuum chamber, a step of placing the sample on the sample electrode, and a step of irradiating the plasma containing the impurity ions so as to implant the impurity ions into the sample, and doping the impurity into the sample by sputtering from the film containing the impurity fixed to the inner wall of the vacuum chamber.</p>
申请公布号 EP1881523(A1) 申请公布日期 2008.01.23
申请号 EP20060746306 申请日期 2006.05.11
申请人 PANASONIC CORPORATION 发明人 SASAKI, YUICHIRO;OKASHITA, KATSUMI;ITO, HIROYUKI;MIZUNO, BUNJI;OKUMURA, TOMOHIRO
分类号 H01L21/223;C23C14/48;H01J37/32;H01L21/265 主分类号 H01L21/223
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